Burn-In Testing Methods

Reliable building blocks are an essential step towards a reliable product. Burn-In combines high junction temperatures with voltage stress to speed up failures due to chip contamination, etc. and provides an established method of improving the reliability of electronic components.

Sharetree offer a comprehensive range of Burn-In systems for components and sub-assemblies. Systems may be configured for low-cost Static, Dynamic, or Monitored Burn-In including built-in functional test if required.